Engineering and TechnologyNature Communications
Wafer-scale and universal van der Waals metal semiconductor contact
L. Kong, R. Wu, et al.
Explore the groundbreaking advancements in integrating van der Waals metallic contacts with two-dimensional semiconductors, significantly reducing contact resistance and Fermi level pinning. This innovative wafer-scale approach, utilizing a thermally decomposable polymer buffer layer, has been developed by a team of experts including Lingan Kong, Ruixia Wu, and Yang Chen.
Related Publications
Explore these studies to deepen your understanding
Adjacent work that informs or extends this paper's methodology and findings.
Engineering and Technology
MXene-GaN van der Waals metal-semiconductor junctions for high performance multiple quantum well photodetectors
L. Luo, Y. Huang, et al.
Engineering and Technology
Chip-integrated van der Waals PN heterojunction photodetector with low dark current and high responsivity
R. Tian, X. Gan, et al.
Physics
High-throughput bandstructure simulations of van der Waals hetero-bilayers formed by 1T and 2H monolayers
R. Dong, A. Jacob, et al.
Physics
The composition and structure of the ubiquitous hydrocarbon contamination on van der Waals materials
A. Pálinkás, G. Kálvin, et al.

