logo
ResearchBunny Logo
Greatly enhanced tunneling electroresistance in ferroelectric tunnel junctions with a double barrier design

Engineering and Technology

Greatly enhanced tunneling electroresistance in ferroelectric tunnel junctions with a double barrier design

W. Xiao, X. Zheng, et al.

This groundbreaking study by Wei Xiao and colleagues unveils a double barrier design for ferroelectric tunnel junctions, achieving a remarkable tunneling electroresistance ratio of 2.210 × 10⁶. With the capability to independently control polarization across barriers, this innovation presents exciting possibilities for multi-state memory technology.

00:00
00:00
~3 min • Beginner • English
Abstract
We propose that the double barrier effect can substantially enhance tunneling electroresistance (TER) in ferroelectric tunnel junctions (FTJs). We design a Pt/BaTiO3/LaAlO3/Pt/BaTiO3/LaAlO3/Pt double-barrier ferroelectric tunnel junction (DB-FTJ), effectively two identical Pt/BaTiO3/LaAlO3/Pt single-barrier FTJs (SB-FTJs) in series. Density-functional calculations yield a giant TER ratio of 2.210 × 10^6 (2.210 × 10^8%) for the DB-FTJ—at least three orders of magnitude larger than that of comparable SB-FTJs—together with an ultra-low resistance–area product (RA) of 0.093 kΩ·µm^2 in the high-conductance state. Independent control of the polarization in the two ferroelectric barriers enables four distinct resistance states, making DB-FTJs promising for multi-state memory applications.
Publisher
npj Computational Materials
Published On
Aug 14, 2023
Authors
Wei Xiao, Xiaohong Zheng, Hua Hao, Lili Kang, Lei Zhang, Zhi Zeng
Tags
ferroelectric tunnel junctions
tunneling electroresistance
double barrier design
multi-state memory
density functional calculations
Listen, Learn & Level Up
Over 10,000 hours of research content in 25+ fields, available in 12+ languages.
No more digging through PDFs, just hit play and absorb the world's latest research in your language, on your time.
listen to research audio papers with researchbunny