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Massively parallel electro-optic sampling of space-encoded optical pulses for ultrafast multi-dimensional imaging

Engineering and Technology

Massively parallel electro-optic sampling of space-encoded optical pulses for ultrafast multi-dimensional imaging

Y. Na, H. Kwak, et al.

Explore how a groundbreaking line-scan time-of-flight camera developed by a team from KAIST and KRISS enables fast, high-resolution 3D imaging of intricate micro- and nano-scale structures, achieving sub-nanometer accuracy in measurements.

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Playback language: English
Abstract
High-speed, high-resolution imaging of surface profiles is crucial for investigating micro- and nano-scale device structures and mechanical dynamics. This paper demonstrates a line-scan time-of-flight (TOF) camera using electro-optic sampling with a frequency comb, enabling simultaneous TOF measurements of over 1000 spatial coordinates with hundreds of megapixels/s pixel rate and sub-nanometer axial resolution. This technology facilitates fast and precise 3D imaging of complex structures and dynamics in various devices and resonators.
Publisher
Light: Science & Applications
Published On
Authors
Yongjin Na, Hyunsoo Kwak, Changmin Ahn, Seung Eon Lee, Woojin Lee, Chu-Shik Kang, Jungchul Lee, Junho Suh, Hongki Yoo, Jungwon Kim
Tags
imaging
time-of-flight
3D imaging
surface profiles
nano-scale
electro-optic sampling
frequency comb

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