Engineering and Technology

Bottom-up construction of low-dimensional perovskite thick films for high-performance X-ray detection and imaging

S. Dong, Z. Fan, et al.

Discover a groundbreaking method developed by Siyin Dong and colleagues to fabricate high-quality, thick quasi-two-dimensional perovskite films for X-ray detection. Their innovative approach led to significant sensitivity improvements and lower detection limits, revolutionizing advanced imaging technology.

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Abstract

This paper presents a novel approach for fabricating high-quality, thick quasi-two-dimensional (Q-2D) perovskite films for X-ray detection. By regulating the crystal growth in a mixed atmosphere of methylamine and ammonia, the authors successfully produced films hundreds of micrometers thick. Incorporating these films into a TiO₂ heterojunction X-ray detector significantly enhanced sensitivity (29721.4 µC Gyair⁻¹ cm⁻²) and lowered the detection limit (20.9 nGyair s⁻¹). A fabricated flat panel X-ray imager (FPXI) demonstrated high spatial resolution (3.6 lp mm⁻¹), showcasing the potential of this method for advanced imaging technology.

Publisher

Light: Science & Applications

Published On

Mar 15, 2024

Authors

Siyin Dong, Zhenghui Fan, Wei Wei, Shujie Tie, Ruihan Yuan, Bin Zhou, Ning Yang, Xiaojia Zheng, Liang Shen

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