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DeepFocus: fast focus and astigmatism correction for electron microscopy
PhysicsNature Communications

DeepFocus: fast focus and astigmatism correction for electron microscopy

P. J. Schubert, R. Saxena, et al.

Discover how DeepFocus, developed by P. J. Schubert, R. Saxena, and J. Kornfeld, revolutionizes 2D and 3D scanning electron microscopy with its data-driven approach, allowing rapid correction of aberrations under low signal-to-noise conditions and minimizing the need for expert adjustments.... show more
Introduction
Literature Review
Methodology
Key Findings
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Limitations
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