Engineering and Technology

A quantum sensing metrology for magnetic memories

V. J. Borràs, R. Carpenter, et al.

This groundbreaking research, conducted by Vicent J. Borràs, Robert Carpenter, Liza Žaper, Siddharth Rao, Sebastien Couet, Mathieu Munsch, Patrick Maletinsky, and Peter Rickhaus, unveils a non-contact metrology technique leveraging scanning NV magnetometry for detailed analysis of Magnetic Random Access Memory at the bit level. The findings not only reveal critical magnetic properties but also pave the way for enhanced failure analysis in MRAM production.

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