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Abstract
This paper presents a 3D stochastic interferometer capable of detecting picometer deformations and minute dielectric fluctuations within its optical volume. Utilizing a frequency-domain approach, the interferometer surpasses the rate limitations of time-domain speckle metrology. A centimeter-sized, high-reflectivity Lambertian cavity filled with a coherent monochromatic photon gas generates statistically isotropic and homogeneous 3D interference patterns. Changes in these patterns, due to cavity deformations or dielectric fluctuations, are detected with high sensitivity, exceeding that of conventional light scattering techniques by a factor of 100.
Publisher
Communications Physics
Published On
Sep 26, 2022
Authors
Guillaume Graciani, Marcel Filoche, François Amblard
Tags
3D interferometer
stochastic metrology
picometer detection
dielectric fluctuations
high sensitivity
Lambertian cavity
optical volume
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