Physics

Work function seen with sub-meV precision through laser photoemission

Y. Ishida, J. K. Jung, et al.

Discover groundbreaking precision in work function measurement, revealing surface electronic structures with unmatched accuracy. This research, conducted by Y. Ishida, J. K. Jung, M. S. Kim, J. Kwon, Y. S. Kim, D. Chung, I. Song, C. Kim, T. Otsu, and Y. Kobayashi, employs angle-resolved photoemission spectroscopy to achieve sub-meV precision with remarkable stability, enhancing our understanding of surface phenomena.

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