Solution-processed quantum-dot light-emitting diodes combining ultrahigh operational stability, shelf stability, and luminance

The shelf-stability issue, originating from the ZnO-induced positive aging effect, poses a significant challenge to industrializing solution-processed QLED display technology. Existing approaches cannot simultaneously suppress exciton quenching by ZnO-based ETLs and retain ZnO’s advantages. This work proposes an ETL bilayer where a SnO₂ nanoparticle buffer suppresses QD–ETL exciton quenching and tunes charge balance, while ZnO nanoparticles provide high electron conductivity. With capped ZnO and a SnO₂ buffer, bottom-emitting QLEDs achieve maximum luminance over 100,000 cd m^-2 and a T95 operational lifetime averaging 6200 h at 1000 cd m^-2, while entirely inhibiting positive aging.

Zi Ye, Mengyu Chen, Xingtong Chen, Wenchen Ma, Xiaojuan Sun, Longjia Wu, Xiongfeng Lin, Yu Chen, Song Chen