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Abstract
A methodology combining high-acceptance angle-resolved photoelectron time-of-flight spectroscopy and ghost imaging is presented for enhancing the spectral characterization of x-ray free-electron laser pulses. This noninvasive high-resolution x-ray diagnostic improves energy resolution from ~1 to 0.5 eV, benefiting ultrafast x-ray spectroscopy by serving as a transparent beamsplitter for applications like transient absorption spectroscopy and covariance-based x-ray nonlinear spectroscopies.
Publisher
Communications Physics
Published On
Jul 25, 2022
Authors
Kai Li, Joakim Laksman, Tommaso Mazza, Gilles Doumy, Dimitris Koulentianos, Alessandra Picchiotti, Svitozar Serkez, Nina Rohringer, Markus Ilchen, Michael Meyer, Linda Young
Tags
x-ray spectroscopy
free-electron lasers
photoelectron spectroscopy
ghost imaging
energy resolution
noninvasive diagnostics
ultrafast science
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