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Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses

Physics

Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses

K. Li, J. Laksman, et al.

Discover a revolutionary methodology that combines high-acceptance angle-resolved photoelectron time-of-flight spectroscopy and ghost imaging to enhance the spectral characterization of x-ray free-electron laser pulses. The research, conducted by an expert team of authors, significantly improves energy resolution for ultrafast x-ray spectroscopy applications.

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