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Direct observation of hot-electron-enhanced thermoelectric effects in silicon nanodevices

Physics

Direct observation of hot-electron-enhanced thermoelectric effects in silicon nanodevices

H. Xue, R. Qian, et al.

Discover groundbreaking research by Huanyi Xue and colleagues using nanothermometric imaging to unveil significant thermoelectric effects in silicon nanoconstriction devices. Witness how hot carriers might revolutionize thermal management in next-gen nanoelectronics!

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Playback language: English
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