logo
ResearchBunny Logo
Controlled growth of a single carbon nanotube on an AFM probe

Engineering and Technology

Controlled growth of a single carbon nanotube on an AFM probe

B. Cheng, S. Yang, et al.

This innovative study by Biyao Cheng, Shuming Yang, and colleagues demonstrates a breakthrough method for fabricating carbon nanotube probes with a yield rate exceeding 93%. These probes simplify the scanning of complex nanostructures, revolutionizing applications in nanotechnology.

00:00
00:00
~3 min • Beginner • English
Abstract
Carbon nanotubes (CNTs) can be used as atomic force microscopy (AFM) tips for high-resolution scanning due to their small diameter, high aspect ratio and outstanding wear resistance. However, previous approaches for fabricating CNT probes are complex and poorly controlled. In this paper, we introduce a simple method to selectively fabricate a single CNT on an AFM tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip. The yield rate is over 93%. The resulting CNT probes are suitable in length, without the need for a subsequent cutting process. We used the CNT probe to scan the complex nanostructure with a high aspect ratio, thereby solving the long-lasting problem of mapping complex nanostructures.
Publisher
Microsystems & Nanoengineering
Published On
Mar 10, 2021
Authors
Biyao Cheng, Shuming Yang, Wei Li, Shi Li, Shareen Shafique, Dong Wu, Shengyun Ji, Yu Sun, Zhuangde Jiang
Tags
carbon nanotube
atomic force microscopy
probe fabrication
high aspect ratio
nanostructures
yield rate
Listen, Learn & Level Up
Over 10,000 hours of research content in 25+ fields, available in 12+ languages.
No more digging through PDFs, just hit play and absorb the world's latest research in your language, on your time.
listen to research audio papers with researchbunny