Controlled growth of a single carbon nanotube on an AFM probe | ResearchBunny

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Abstract

This paper introduces a simple method to selectively fabricate a single carbon nanotube (CNT) on an atomic force microscopy (AFM) tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip. The yield rate is over 93%. The resulting CNT probes are suitable in length, without the need for a subsequent cutting process. The CNT probe successfully scanned complex nanostructures with a high aspect ratio.

Publisher

Microsystems & Nanoengineering

Published On

Mar 10, 2021

Authors

Biyao Cheng, Shuming Yang, Wei Li, Shi Li, Shareen Shafique, Dong Wu, Shengyun Ji, Yu Sun, Zhuangde Jiang

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