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Controlled growth of a single carbon nanotube on an AFM probe

Engineering and Technology

Controlled growth of a single carbon nanotube on an AFM probe

B. Cheng, S. Yang, et al.

This innovative study by Biyao Cheng, Shuming Yang, and colleagues demonstrates a breakthrough method for fabricating carbon nanotube probes with a yield rate exceeding 93%. These probes simplify the scanning of complex nanostructures, revolutionizing applications in nanotechnology.

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Playback language: English
Abstract
This paper introduces a simple method to selectively fabricate a single carbon nanotube (CNT) on an atomic force microscopy (AFM) tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip. The yield rate is over 93%. The resulting CNT probes are suitable in length, without the need for a subsequent cutting process. The CNT probe successfully scanned complex nanostructures with a high aspect ratio.
Publisher
Microsystems & Nanoengineering
Published On
Mar 10, 2021
Authors
Biyao Cheng, Shuming Yang, Wei Li, Shi Li, Shareen Shafique, Dong Wu, Shengyun Ji, Yu Sun, Zhuangde Jiang
Tags
carbon nanotube
atomic force microscopy
probe fabrication
high aspect ratio
nanostructures
yield rate
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