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Anomalous 3D nanoscale photoconduction in hybrid perovskite semiconductors revealed by tomographic atomic force microscopy

Engineering and Technology

Anomalous 3D nanoscale photoconduction in hybrid perovskite semiconductors revealed by tomographic atomic force microscopy

J. Song, Y. Zhou, et al.

This study, conducted by Jingfeng Song, Yuanyuan Zhou, Nitin P. Padture, and Bryan D. Huey, uncovers the vital role of grain boundaries in hybrid perovskite semiconductors through innovative tomographic atomic force microscopy. Discover how GBs act as interconnected conducting channels and the implications for optimizing these materials in optoelectronic applications.

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~3 min • Beginner • English
Abstract
While grain boundaries (GBs) in conventional inorganic semiconductors are frequently considered as detrimental for photogenerated carrier transport, their exact role remains obscure for the emerging hybrid perovskite semiconductors. A primary challenge for GB-property investigations is that experimentally they need to be performed at the top surface, which is not only insensitive to depth-dependent inhomogeneities but also could be susceptible to topographic artifacts. Accordingly, we have developed a unique approach based on tomographic atomic force microscopy, achieving a fully-3D, photogenerated carrier transport map at the nanoscale in hybrid perovskites. This reveals GBs serving as highly interconnected conducting channels for carrier transport. We have further discovered the coexistence of two GB types in hybrid perovskites, one exhibiting enhanced carrier mobilities, while the other is insipid. Our approach reveals otherwise inaccessible buried features and previously unresolved conduction pathways, crucial for optimizing hybrid perovskites for various optoelectronic applications including solar cells and photodetectors.
Publisher
Nature Communications
Published On
Jul 21, 2020
Authors
Jingfeng Song, Yuanyuan Zhou, Nitin P. Padture, Bryan D. Huey
Tags
grain boundaries
hybrid perovskite
semiconductors
carrier mobility
tomographic atomic force microscopy
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