logo
Loading...
Using scalable computer vision to automate high-throughput semiconductor characterization

Engineering and Technology

Using scalable computer vision to automate high-throughput semiconductor characterization

A. E. Siemenn, E. Aissi, et al.

Experience a breakthrough in materials characterization! This innovative research by Alexander E. Siemenn, Eunice Aissi, Fang Sheng, Armi Tiihonen, Hamide Kavak, Basita Das, and Tonio Buonassisi introduces automated tools using adaptive computer vision to speed up property characterization by 85 times, transforming the way we analyze mixed-cation perovskites.... show more
Citation Metrics
Citations
16
Influential Citations
1
Reference Count
78
Citation by Year

Note: The citation metrics presented here have been sourced from Semantic Scholar and OpenAlex.

Listen, Learn & Level Up
Over 10,000 hours of research content in 25+ fields, available in 22+ languages.
No more digging through PDFs, just hit play and absorb the world's latest research in your language, on your time.
listen to research audio papers with researchbunny