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Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy

Physics

Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy

O. Zandi, A. E. Sykes, et al.

Explore groundbreaking research by Omid Zandi and colleagues as they harness ultrafast electron microscopy to visualize the dynamic transformation of a 3D photoemitted electron gas in a magnetic field, revealing intriguing periodic oscillations and lensing effects. This work paves the way for deeper insights into electron and plasma dynamics.

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~3 min • Beginner • English
Abstract
Understanding and controlling ultrafast charge carrier dynamics is of fundamental importance in diverse fields of (quantum) science and technology. Here, we create a three-dimensional hot electron gas through two-photon photoemission from a copper surface in vacuum. We employ an ultrafast electron microscope to record movies of the subsequent electron dynamics on the picosecond-nanosecond time scale. After a prompt Coulomb explosion, the subsequent dynamics is characterized by a rapid oblate-to-prolate shape transformation of the electron gas, and periodic and long-lived electron cyclotron oscillations inside the magnetic field of the objective lens. In this regime, the collective behavior of the oscillating electrons causes a transient, mean-field lensing effect and pronounced distortions in the images. We derive an analytical expression for the time-dependent focal length of the electron-gas lens, and perform numerical electron dynamics and probe image simulations to determine the role of Coulomb self-fields and image charges. This work inspires the visualization of cyclotron dynamics inside two-dimensional electron-gas materials and enables the elucidation of electron/plasma dynamics and properties that could benefit the development of high-brightness electron and X-ray sources.
Publisher
Nature Communications
Published On
Jun 12, 2020
Authors
Omid Zandi, Allan E. Sykes, Ryan D. Cornelius, Francis M. Alcorn, Brandon S. Zerbe, Phillip M. Duxbury, Bryan W. Reed, Renske M. van der Veen
Tags
ultrafast electron microscopy
photoemission
electron gas
magnetic field
cyclotron dynamics
Coulomb self-fields
transient lensing
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