Engineering and TechnologyScientific Reports
Quantitative material analysis using secondary electron energy spectromicroscopy
W. Han, M. Zheng, et al.
This groundbreaking research showcases the innovative use of secondary electron energy spectroscopy (SEES) within a scanning electron microscope (SEM), providing insights into atomic number mapping and bulk valence band density of states. Conducted by W. Han, M. Zheng, A. Banerjee, Y. Z. Luo, L. Shen, and A. Khursheed, it reveals high accuracy in material analysis, establishing SEES as a key tool for low-voltage SEM applications.
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