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Non-line-of-sight imaging with arbitrary illumination and detection pattern

Engineering and Technology

Non-line-of-sight imaging with arbitrary illumination and detection pattern

X. Liu, J. Wang, et al.

This groundbreaking research by Xintong Liu, Jianyu Wang, Leping Xiao, Zuoqiang Shi, Xing Fu, and Lingyun Qiu introduces a novel Bayesian framework for non-line-of-sight imaging, allowing for high-quality reconstructions even with irregular measurement patterns, which vastly broadens real-world applications.

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