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Nanoscale imaging of super-high-frequency microelectromechanical resonators with femtometer sensitivity

Physics

Nanoscale imaging of super-high-frequency microelectromechanical resonators with femtometer sensitivity

D. Lee, S. Jahanbani, et al.

Delve into groundbreaking research on nanoscale imaging of super-high-frequency resonators conducted by Daehun Lee, Shahin Jahanbani, Jack Kramer, Ruochen Lu, and Keji Lai. This study reveals remarkable mode profiles and sensitivity advancements, paving the way for innovations in MEMS technology for telecommunications and quantum sciences.

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