This paper presents a novel method for probing the spatial profile of an operational magnetic nanodevice using magnetic force microscopy (MFM). A customized microwave probe station was integrated into an MFM system to allow simultaneous electrical and microwave contact with the devices during MFM scanning. The method was used to image operational nanoconstriction-based spin Hall nano-oscillators (SHNOs), revealing spatial profiles consistent with simulations of current density and induced Oersted fields. While the current system's resolution doesn't allow for visualizing GHz magnetization oscillations, future work incorporating a faster tapping mode MFM is proposed.

S.A.H. Banuazizi, M. Kargar, A.A. Awad, A. Dmitriev