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Abstract
This study investigates spatial and temporal variations in the moiré pattern of twisted bilayer graphene (TBG) using aberration-corrected Low Energy Electron Microscopy (AC-LEEM). The researchers found smaller spatial variations than previously reported and observed thermal fluctuations corresponding to collective atomic displacements. No untwisting was observed up to 600°C, suggesting thermal annealing can reduce local disorder. Edge dislocations in the underlying atomic lattice were also observed, with the moiré structure acting as a magnifier, potentially exhibiting unique local electronic properties.
Publisher
Nature Communications
Published On
Jan 10, 2022
Authors
Tobias A. de Jong, Tjerk Benschop, Xingchen Chen, Eugene E. Krasovskii, Michiel J. A. de Dood, Rudolf M. Tromp, Milan P. Allan, Sense Jan van der Molen
Tags
twisted bilayer graphene
moiré pattern
thermal fluctuations
edge dislocations
atomic displacements
low energy electron microscopy
local electronic properties
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