Engineering and Technology

Enhanced detection of threat materials by dark-field x-ray imaging combined with deep neural networks

T. Partridge, A. Astolfo, et al.

This groundbreaking research by T. Partridge, A. Astolfo, S. S. Shankar, F. A. Vittoria, M. Endrizzi, S. Arridge, T. Riley-Smith, I. G. Haig, D. Bate, and A. Olivo reveals how combining dark-field x-ray imaging with deep neural networks significantly enhances the detection of threat materials. The study showcases proof-of-concept experiments that showcase remarkable improvements in material identification, promising advancements in security technologies.