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Direct observation of strong surface reconstruction in partially reduced nickelate films

Physics

Direct observation of strong surface reconstruction in partially reduced nickelate films

C. Yang, R. Pons, et al.

This groundbreaking study by Chao Yang and colleagues explores the surface structure of Pr0.8Sr0.2NiO2+x films, revealing intriguing insights into surface polarity and atomic-level phenomena, including the effects of oxygen vacancies from topochemical reduction.

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Playback language: English
Abstract
This study investigates the surface structure of Pr<sub>0.8</sub>Sr<sub>0.2</sub>NiO<sub>2+x</sub> (0<x<1) films using annular bright-field imaging and four-dimensional scanning transmission electron microscopy (4D-STEM). A polar distortion coupled with octahedral rotations is observed in a fully oxidized sample, and a stronger polar distortion in a partially reduced sample, extending about three unit cells from the surface. 4D-STEM directly images the local atomic electric field, revealing distinct Ni valence variations confirmed by atomic-resolution electron energy-loss spectroscopy (EELS). The strong surface reconstruction in the reduced sample is linked to oxygen vacancy formation from topochemical reduction. These findings offer insights into surface polarity at the atomic level.
Publisher
Nature Communications
Published On
Jan 09, 2024
Authors
Chao Yang, Rebecca Pons, Wilfried Sigle, Hongguang Wang, Eva Benckiser, Gennady Logvenov, Bernhard Keimer, Peter A. van Aken
Tags
Pr0.8Sr0.2NiO2+x
surface structure
4D-STEM
polar distortion
oxygen vacancy
electron energy-loss spectroscopy

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