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Chip-integrated van der Waals PN heterojunction photodetector with low dark current and high responsivity

Engineering and Technology

Chip-integrated van der Waals PN heterojunction photodetector with low dark current and high responsivity

R. Tian, X. Gan, et al.

Discover the groundbreaking advancements in photodetection with our van der Waals PN heterojunction device, integrating p-type black phosphorus and n-type molybdenum telluride on a silicon nitride waveguide. This innovative research, conducted by Ruijuan Tian and colleagues from Northwestern Polytechnical University, demonstrates dramatically reduced dark current and impressive responsivity, promising a new frontier in optical technologies.

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Playback language: English
Abstract
This paper reports on a van der Waals PN heterojunction photodetector, composed of p-type black phosphorus and n-type molybdenum telluride, integrated on a silicon nitride waveguide. The built-in electric field significantly suppresses dark current and improves responsivity. With a 1V bias, the dark current is below 7nA, over two orders of magnitude lower than other waveguide-integrated black phosphorus photodetectors. Responsivity reaches 577 mA/W, increasing to 709 mA/W with electrostatic doping. The device shows a ~1.0 GHz response bandwidth and uniform photodetection from 1500 to 1630 nm.
Publisher
Light: Science & Applications
Published On
Nov 01, 2022
Authors
Ruijuan Tian, Xuetao Gan, Chen Li, Xiaoqing Chen, Siqi Hu, Linpeng Gu, Dries Van Thourhout, Andres Castellanos-Gomez, Zhipei Sun, Jianlin Zhao
Tags
van der Waals
photodetector
black phosphorus
molybdenum telluride
responsivity
dark current
silicon nitride
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