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Characterization of spring and durum wheat using non-destructive synchrotron phase contrast X-ray microtomography during storage

Food Science and Technology

Characterization of spring and durum wheat using non-destructive synchrotron phase contrast X-ray microtomography during storage

N. S. Indore, C. Karunakaran, et al.

This groundbreaking study by Navanth S. Indore and colleagues delves into the post-harvest losses of cereal grain storage, revealing that spring wheat varieties outshine durum varieties in resilience during storage. Using advanced synchrotron imaging techniques, the research offers critical insights to optimize storage practices and enhance breeding strategies for stronger crops.

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Playback language: English
Abstract
Post-harvest losses during cereal grain storage are a significant concern. This study used synchrotron phase contrast X-ray microtomography to characterize the internal structures of spring and durum wheat varieties during storage. Six varieties (three of each type) were stored for five weeks at 17% moisture content. Results showed that spring wheat varieties performed better than durum varieties, with less deterioration visible. Freezing did not further affect seed structure. The high-resolution data provides insights for improving storage practices and breeding more resilient varieties.
Publisher
npj Science of Food
Published On
Mar 01, 2024
Authors
Navanth S. Indore, Chithra Karunakaran, Digvir S. Jayas, Jarvis Stobbs, Miranda Vu, Kaiyang Tu, Omar Marinos
Tags
post-harvest losses
cereal grain storage
spring wheat
durum wheat
X-ray microtomography
seed structure

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