Engineering and Technology

Artificial-intelligence-driven scanning probe microscopy

A. Krull, P. Hirsch, et al.

Discover DeepSPM, an innovative AI framework revolutionizing scanning probe microscopy by enabling autonomous operations. This groundbreaking research by A. Krull, P. Hirsch, C. Rother, A. Schiffrin, and C. Krull showcases how machine learning can optimize surface imaging with atomic precision, enhancing data acquisition even in demanding conditions.

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