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Statistically bias-corrected and downscaled climate models underestimate the adverse effects of extreme heat on U.S. maize yields

Agriculture

Statistically bias-corrected and downscaled climate models underestimate the adverse effects of extreme heat on U.S. maize yields

D. C. Lafferty, R. L. Sriver, et al.

This study reveals how different climate modeling approaches significantly affect projections of U.S. maize yields, demonstrating the critical trade-offs between accuracy and confidence in future yield forecasts. This compelling research was conducted by David C. Lafferty, Ryan L. Sriver, Iman Haqiqi, Thomas W. Hertel, Klaus Keller, and Robert E. Nicholas.

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~3 min • Beginner • English
Abstract
Efforts to understand and quantify how a changing climate can impact agriculture often rely on bias-corrected and downscaled climate information, making it important to quantify potential biases of this approach. Here, we use a multi-model ensemble of statistically bias-corrected and downscaled climate models, as well as the corresponding parent models from the Coupled Model Intercomparison Project Phase 5 (CMIP5), to drive a statistical panel model of U.S. maize yields that incorporates season-wide measures of temperature and precipitation. We analyze uncertainty in annual yield hindcasts, finding that the CMIP5 models considerably overestimate historical yield variability while the bias-corrected and downscaled versions underestimate the largest weather-induced yield declines. We also find large differences in projected yields and other decision-relevant metrics throughout this century, leaving stakeholders with modeling choices that require navigating trade-offs in resolution, historical accuracy, and projection confidence.
Publisher
Communications Earth & Environment
Published On
Sep 20, 2021
Authors
David C. Lafferty, Ryan L. Sriver, Iman Haqiqi, Thomas W. Hertel, Klaus Keller, Robert E. Nicholas
Tags
climate model projections
bias-correction
downscaling
U.S. maize yields
statistical panel model
CMIP5 models
yield variability
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