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Optimal acceleration voltage for near-atomic resolution imaging of layer-stacked 2D polymer thin films

Chemistry

Optimal acceleration voltage for near-atomic resolution imaging of layer-stacked 2D polymer thin films

B. Liang, Y. Zhang, et al.

This groundbreaking study by Baokun Liang et al. demonstrates that adjusting the incident electron energy can significantly enhance the resolution of high-resolution transmission electron microscopy (HRTEM) images. With an impressive resolution of 1.9 Å at 120 kV, the research uncovers unexpected molecular interstitial defects in two imine-based 2D polymer thin films and sheds light on functional groups at pore interfaces in amorphous organic materials.

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Playback language: English
Abstract
High-resolution imaging of organic two-dimensional (2D) materials is challenging despite advancements in transmission electron microscopes (TEM). This study reveals that selecting the incident electron energy is crucial for improving image resolution. Among various acceleration voltages (300 kV, 200 kV, 120 kV, and 80 kV), 120 kV yielded the highest resolution (1.9 Å) in HRTEM images of two imine-based 2D polymer thin films, revealing unexpected molecular interstitial defects. Quantum mechanical calculations identified the defects' structural nature, and the enhanced resolution and contrast at 120 kV facilitated the detection of functional groups at pore interfaces. This approach was also successful for an amorphous organic 2D material.
Publisher
NATURE COMMUNICATIONS
Published On
Jul 08, 2022
Authors
Baokun Liang, Yingying Zhang, Christopher Leist, Zhaowei Ou, Miroslav Položij, Zhiyong Wang, David Mücke, Renhao Dong, Zhikun Zheng, Thomas Heine, Xinliang Feng, Ute Kaiser, Haoyuan Qi
Tags
high-resolution imaging
two-dimensional materials
electron microscopy
interstitial defects
HRTEM
quantum mechanical calculations
organic materials

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